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IEEE Electron Device Letters > 2012 > 33 > 9 > 1300 - 1302
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 2 > 244 - 247
2009 IEEE Sensors > 777 - 780
IEEE Transactions on Nuclear Science > 2009 > 56 > 5-2 > 2916 - 2924