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Small-delay faults may escape detection by transition fault patterns, but traditional transition fault simulator can not detect this phenomenon. A fault simulator detecting test escape of small-delay faults is presented. The sizes of the faults are less than one system clock cycle. For our method, the delay distribution in the CUT is considered, and the fault size is quantized as times of the propagation...
We present a simulator which determines the coverage of small-delay faults, i.e., delay faults with a size below one clock cycle, caused by resistive-open defects. These defects are likely to escape detection by stuck-at or transition fault patterns. For the first time, we couple the calculation of the critical size of a small-delay fault with the computation of the resistance range of the corresponding...
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