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IEEE Electron Device Letters > 2017 > 38 > 2 > 168 - 171
IEEE Sensors Journal > 2008 > 8 > 7 > 1324 - 1329
IRE Transactions on Reliability and Quality Control > 1958 > PGRQC-14 > 60 - 68
IEEE Electron Device Letters > 2017 > 38 > 2 > 168 - 171
IEEE Sensors Journal > 2008 > 8 > 7 > 1324 - 1329
IRE Transactions on Reliability and Quality Control > 1958 > PGRQC-14 > 60 - 68