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In this study, the reliabilities of low Ag SAC alloys doped with Mn or Ce (SACM or SACC) were evaluated under JEDEC drop, dynamic bending, thermal cycling, and cyclic bending test conditions against eutectic SnPb, SAC105, and SAC305 alloys. The Mn or Ce doped low cost SAC105 alloys achieved a higher drop test and dynamic bending test reliability than SAC105 and SAC305, and exceeded SnPb for some test...
The morphological features and growth kinetics of interfacial IMCs have shown significant effect on the mechanical properties, and hence, on the reliability of lead free solder joints. The growth behavior of the interfacial IMCs of SnAgCu/Cu solder joint, in reflow and thermal cycling, was investigated with the focus on the influence of reflow dwell time and the cyclic parameters on the growth kinetics...
The effect of thermal aging on the microstructure evolution and solder joint reliability in hard disk drive (HDD) under mechanical shock was investigated. Significant coarsening of Ag3 Sn particles was found in SnAgCu solder, and AuSn4 intermetallic compound (IMC) changed from needle-type to layer-type during aging. For as-soldered SnAgCu solder joints after mechanical shock, the cracks were initiated...
Recently, preventing environmental pollutions, Pb-free solders are about to replace Sn-Pb eutectic solders. Sn-Ag-Cu alloys are leading candidates for Pb-free solders. However, Sn-Ag-Cu alloys were not enough to meet severe board level reliability requirements. In particular, thermal fatigue failure still has the problem. The interfacial strength decreases with intermetallic compounds (IMC) formation...
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