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RF and analog BIST techniques are capable of replacing the traditional error vector magnitude (EVM) test used in production. In a case study, four BISTs detected actual production faults in a commercial, highly integrated WLAN device. In combination with traditional digital testing, the BISTs caught an impressive 100% of EVM failures during production of over a million devices, which presents significant...
This paper describes RF built-in self test (BiST) techniques to test the performance of a RF CMOS integrated wireless transceiver using on-chip digital resources as both the stimuli and response analyzer. Using a defect-oriented approach, key RF blocks as well as the overall functionality and performance of the device are analyzed using a combination of block level and loopback testing. Using these...
This paper discusses motivation and design of an offset mixer and investigates its optimum placement in loopback test setup for on-chip RF test. Based on this study, design and implementation of an offset mixer for on-chip RF testing of radio front ends is presented. The offset mixer is passive in nature reducing silicon area and power overheads. Mixer is implemented in 0.13 μm CMOS process and the...
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