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A Build-In Self-Test (BiST) circuit suitable for embedded RF Mixers in System-on-Chip applications is presented in this paper. This is a defect-oriented test scheme that dynamically sets the Mixer to operate in homodyne mode. The DC level generated at its output is used to control the oscillation frequency of a simple voltage controlled oscillator. Deviations of the oscillation frequency from the...
This paper proposes a self-calibrating approach for embedded RF down-conversion mixers. In the proposed approach, the output of the RF mixer is analyzed by using on-chip resources for testing and the mixer performs self-compensation for parametric defects using tuning knobs. The tuning knobs enable the RF mixer to self-calibrate for multi-parameter variations induced due to process variability. Using...
In this paper, a sequential test technique is proposed to test a RF front-end receiver. With this technique the test circuitry can be reused by the receiver building blocks.The method is suitable to be fully integrated on-chip. Moreover, the test area overhead has been kept low by using the receiver LO in the test circuitry. Therefore the test circuitry required to generate the test stimuli are an...
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