Search results
IEEE Transactions on Plasma Science > 2017 > 45 > 6 > 913 - 917
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 1 > 138 - 145
IEEE Transactions on Plasma Science > 2016 > 44 > 10-2 > 2282 - 2287
IEEE Transactions on Plasma Science > 2016 > 44 > 5 > 870 - 873
IEEE Transactions on Plasma Science > 2016 > 44 > 4-2 > 545 - 548
IEEE Transactions on Plasma Science > 2016 > 44 > 4-2 > 469 - 472
IEEE Transactions on Plasma Science > 2014 > 42 > 10-3 > 3321 - 3327
IEEE Transactions on Plasma Science > 2014 > 42 > 10-1 > 2670 - 2671
IEEE Transactions on Plasma Science > 2014 > 42 > 10-1 > 2498 - 2499
IEEE Transactions on Plasma Science > 2014 > 42 > 10-1 > 2572 - 2573
IEEE Transactions on Plasma Science > 2014 > 42 > 10-1 > 2410 - 2411
IEEE Transactions on Plasma Science > 2014 > 42 > 10-1 > 2376 - 2377
IEEE Transactions on Plasma Science > 2014 > 42 > 10-1 > 2672 - 2673
IEEE Transactions on Plasma Science > 2014 > 42 > 10-1 > 2674 - 2675
IEEE Transactions on Plasma Science > 2014 > 42 > 10-1 > 2348 - 2349