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Small-delay faults may escape detection by transition fault patterns, but traditional transition fault simulator can not detect this phenomenon. A fault simulator detecting test escape of small-delay faults is presented. The sizes of the faults are less than one system clock cycle. For our method, the delay distribution in the CUT is considered, and the fault size is quantized as times of the propagation...
Dependability is becoming a key design aspect of today networked embedded systems (NES's) due to their increasing application to safety-critical tasks. Dependability evaluation must be based on modelling and simulation of faulty application behaviors, which must be related to faulty NES behaviors under actual defects. However, NES's behave differently from traditional embedded systems when testing...
This paper proposes a method to compute delay values in 3-valued fault simulation for test cubes which are test patterns with Xs. Because the detectable delay size of each fault by a test cube is fixed after assigning logic values to the Xs in the test cube, the proposed method computes a range of the delay values of the test patterns covered by the test cube. By using the proposed method, we can...
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