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IEEE Transactions on Circuits and Systems I: Regular Papers > 2013 > 60 > 3 > 548 - 556
2011 International Reliability Physics Symposium > MY.4.1 - MY.4.5
IEEE Electron Device Letters > 2011 > 32 > 8 > 1041 - 1043
2008 NORCHIP > 29 - 32
IEEE Electron Device Letters > 2007 > 28 > 11 > 964 - 966