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Errors due to inevitable cable flexure are one of the major error and uncertainty sources in high-precision S-parameter measurements. Recently developed two-port electronic calibration units allow for determination and correction of these errors. A method is presented where such a unit is applied to de-embed cable flexure errors in S-parameter measurements. In a series of steps, the effects of the...
The analysis and design of a differential six-port reflectometer (SPR) based on a sampled-line structure is presented in this paper. The practical differential SPR is realized in Coplanar Strip (CPS) transmission line form, using two baluns for interfacing with the RF source and device under test (DUT) and four baluns connected to the RF logarithmic detectors. The performance of the proposed differential...
Recently, a measurement technique called S-parameter method using a vector network analyzer has been proposed whereby the differential impedance can be found. In this paper, three compensating methods using ABCD-matrix are adopted to reduce the influence of a jig for the S-parameter method. The results of our proposed methods are presented and compared with a calculated result using the method of...
In recent years, many wireless telecommunication services have spread over the world. It is known that the characteristics of conventional antennas, such as monopole antennas, change considerably when the body of the handset is touched by the hand. This is caused by the variation of the current on the surface of the conducting box used for the handset due to human body influence. To decrease the influence...
A determination of the reference impedance for the three standards line-attenuator-reflect (LAR) on-wafer vector network-analyzer (VNA) calibration is proposed. As a result, it is shown that the reference impedance to which the LAR calibration is referred cannot generally be determined. Based on this consideration, a modified LAR calibration allows a precise determination of the reference impedance...
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