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2009 International Conference on Test and Measurement > 2 > 378 - 381
2008 Congress on Image and Signal Processing > 4 > 176 - 180
2008 Congress on Image and Signal Processing > 2 > 49 - 53
2009 International Conference on Test and Measurement > 2 > 378 - 381
2008 Congress on Image and Signal Processing > 4 > 176 - 180
2008 Congress on Image and Signal Processing > 2 > 49 - 53