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Performance degradation of integrated circuits due to aging effects, such as Negative Bias Temperature Instability (NBTI), is becoming of great concern for current and future CMOS technology. In this paper we propose a monitor able to detect NBTI due late transitions in the combinational part of a critical data-path. It requires lower area than recently proposed alternative solutions, and a lower...
Innovative, simple, miniaturized, low-cost and low-power consumption devices are required in future medical applications. In our laboratory we have developed different devices in this field. Firstly, oxide aluminum-coated interdigitated (ID) Al capacitors have been successfully tested for DNA hybridization test (down to 30 pM target concentrations), as well as for specific bacteria recognition (S...
In deep submicron era, to prevent larger amount of SRAM from more frequently encountered overheating problems and react accordingly for each possible hotspots, multiple ideal run-time temperature sensors must be closely located and response rapidly to secure system reliability while maintaining core frequency. This paper presented a method to extract run-time temperature information from multiple...
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