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This paper reports fabrication, characterization, and testing of the thermal stability of ZnO-based Schottky ultraviolet photodetectors. The ZnO thin film was grown on a p-type Si 〈100〉 substrate by the sol-gel technique. The surface morphological and the structural properties of the thin film were studied by an atomic force microscope (AFM) and a scanning electron microscope (SEM). For the investigation...
A two-step method was used to fabricate vanadium oxide (VOX) thin films. SEM and IR transmittance spectra were employed to reveal the cross-section morphology and optical property, respectively. The surface composition was obtained using XPS. Experimental results indicated that the VOX film was stable until the grains and insulator-metal transition showed up on increasing annealing pressure or prolonging...
Nanostructured copper(II) oxide film was deposited using reactive DC magnetron sputtering. It has been characterized using XRD, EDAX, XPS, and FESEM. The grain size of copper oxide film was found to be 40-65 nm with size distribution. The entire study was divided into two parts. In the first part, the film has been studied for its response to alcohol at different temperatures to find the optimum sensing...
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