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In this work we studied the effect of the magnetron sputtering radio frequency (RF) power on the optical and structural properties of ZnO thin films. The films were characterized by X-ray diffraction (XRD), X-ray reflectometry (XRR) and UV–vis spectroscopy. The XRD results indicate that the films have grown in a wurtzite hexagonal phase with high c-axis (002) preferential orientation. The thickness,...
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