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Solid-phase crystallisation of Si thin films on glass fabricated by plasma enhanced chemical vapour deposition is compared at different annealing temperatures. Four independent techniques, optical transmission microscopy, Raman and UV reflectance spectroscopy, and X-ray diffraction, are used to characterise the crystallisation kinetics and film properties. The 1.5μm thick films with the n+/p−/p+ solar...
In situ X-ray diffraction experiments using synchrotron radiation were performed on Ti–6Al–4V samples to directly observe the α→β phase transformation during heating. These experiments were conducted at the Advanced Photon Source (APS) using a 30keV synchrotron X-ray beam to monitor changes in the α and β phases as a function of heating time under different heating rates. The results were compared...
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