The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
The structural changes of sequentially evaporated thin Cu-In films on molybdenum substrate were studied by the depth profiling technique in an XPS apparatus. Pure metal materials were deposited by vacuum evaporation at room temperature. A specimen of the film was sputter-etched in situ after the deposition with Ar ion beams to obtain the depth profile. Another specimen of the film was annealed at...
The evolution of the elemental composition and chemical bonding of the (112) surface of CuInSe 2 single crystals, cleaned by 4 keV N + and then annealed at temperatures from 200 to 750 o C in vacuum, was analysed using X-ray photoelectron spectroscopy. After annealing at temperatures over 500 o C but below 700 o C the elemental composition approached to CuIn...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.