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IEEE Instrumentation & Measurement Magazine > 2014 > 17 > 2 > 27 - 32
2008 Congress on Image and Signal Processing > 1 > 174 - 183
IEEE Instrumentation & Measurement Magazine > 2014 > 17 > 2 > 27 - 32
2008 Congress on Image and Signal Processing > 1 > 174 - 183