Search results
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 2 > 203 - 208
IEEE Electron Device Letters > 2008 > 29 > 3 > 262 - 264
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 2 > 203 - 208
IEEE Electron Device Letters > 2008 > 29 > 3 > 262 - 264