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2012 IEEE International Reliability Physics Symposium (IRPS) > XT.13.1 - XT.13.4
IEEE Electron Device Letters > 2010 > 31 > 11 > 1211 - 1213
IEEE Electron Device Letters > 2008 > 29 > 4 > 389 - 391
2012 IEEE International Reliability Physics Symposium (IRPS) > XT.13.1 - XT.13.4
IEEE Electron Device Letters > 2010 > 31 > 11 > 1211 - 1213
IEEE Electron Device Letters > 2008 > 29 > 4 > 389 - 391