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Today, the continued miniaturization of field effect transistors (FETs) results in major scaling issues that curtail further voltage reduction. The resultant increase in power consumption density limits the overall performance. Therefore, alternative materials and devices are required that support steep sub-threshold slopes and low-voltage operation. The tunnel FET (TFET) is regarded as the most promising...
Transconductance (gm) enhancement in n-type and p-type nanowire field-effect-transistors (nwFETs) is demonstrated by introducing controlled tensile strain into channel regions by pattern dependant oxidation (PADOX). Values of gm are enhanced relative to control devices by a factor of 1.5 in p-nwFETs and 3.0 in n-nwFETs. Strain distributions calculated by a three-dimensional molecular dynamics simulation...
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