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Power and thermal considerations are becoming limiting factors for submicron circuits as technology scales down. In order to detect abnormal temperature changes so as to detect defects on chip, and increase reliability and service life of devices, an all CMOS temperature sensor for submicron circuits' test is proposed. A current proportion to absolute temperature is generated for achieving linear...
This paper proposes an accurate four-transistor temperature sensor designed, and developed, for thermal testing and monitoring circuits in deep submicron technologies. A previous three-transistor temperature sensor, which utilizes the temperature characteristic of the threshold voltage, shows highly linear characteristics at a power supply voltage of 1.8 V or more; however, the supply voltage is reduced...
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