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We have used a component peak of the C1s XPS spectrum to evaluate surface defects of HOPG induced by keV Ar + radiation: we previously showed that a component 1.0 eV higher than the main C1s peak at 284.6 eV, whose intensity is strongly correlated with the extent of Ar + irradiation, is due to less extensive sp 2 electron delocalization caused by the breaking of surface bonds...
An accurate method of calibrating the absolute surface coverage delivered for metal deposition sources based on a simple ex-situ analysis utilizing atomic absorption spectroscopy with a sensitivity to coverages =<0.10ML is described.The usefulness of the method is demonstrated by two case studies involving growth of ultra-thin Pd films on highly oriented pyrolytic graphite (HOPG) and bimetallic...
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