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IEEE Transactions on Applied Superconductivity > 2017 > 27 > 4-1 > 1 - 5
IEEE Transactions on Instrumentation and Measurement > 2017 > 66 > 6 > 1103 - 1107
IEEE Transactions on Instrumentation and Measurement > 2017 > 66 > 6 > 1598 - 1604
IEEE Transactions on Instrumentation and Measurement > 2017 > 66 > 6 > 1391 - 1396
IEEE Transactions on Instrumentation and Measurement > 2017 > 66 > 6 > 1083 - 1088
IEEE Transactions on Instrumentation and Measurement > 2017 > 66 > 6 > 1237 - 1242
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2015 > 23 > 8 > 1547 - 1551
IEEE Transactions on Instrumentation and Measurement > 2015 > 64 > 6 > 1477 - 1482
IEEE Transactions on Instrumentation and Measurement > 2015 > 64 > 6 > 1364 - 1368
IEEE Transactions on Dielectrics and Electrical Insulation > 2014 > 21 > 3 > 1291 - 1301
IEEE Journal of Photovoltaics > 2014 > 4 > 5 > 1204 - 1211
IEEE Transactions on Instrumentation and Measurement > 2013 > 62 > 6 > 1621 - 1626
IEEE Transactions on Instrumentation and Measurement > 2013 > 62 > 6 > 1615 - 1620
IEEE Transactions on Instrumentation and Measurement > 2013 > 62 > 6 > 1646 - 1651
IEEE Transactions on Instrumentation and Measurement > 2012 > 61 > 8 > 2125 - 2131
IEEE Transactions on Applied Superconductivity > 2011 > 21 > 3-1 > 891 - 895
IEEE Transactions on Instrumentation and Measurement > 2007 > 56 > 2 > 588 - 591