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IEEE Transactions on Semiconductor Manufacturing > 2015 > 28 > 3 > 306 - 317
2009 International Conference on Test and Measurement > 1 > 298 - 302
IEEE Transactions on Semiconductor Manufacturing > 2015 > 28 > 3 > 306 - 317
2009 International Conference on Test and Measurement > 1 > 298 - 302