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This paper proposes a new technique for propagating and diagnosing the faulty LUTs in an FPGA. This technique uses flip-flops and multiplexers for the fault propagation rather than LUTs and therefore the fault free assumption of the LUTs is eliminated. Also this technique diagnosis location of the multiple faulty LUTs precisely thus avoiding any fault masking. This method has been tested on the commercial...
A built-in self-test (BIST) approach is presented for the configurable logic blocks (CLBs) in Xilinx Virtex-5 field programmable gate arrays (FPGAs). A total of 17 configurations were developed to completely test the full functionality of the CLBs, including distributed RAM modes of operation. These configurations cumulatively detect 100% of stuck-at faults in every CLB. There is no area overhead...
We present a built-in self-test (BIST) approach able to detect and accurately diagnose all single and practically all multiple faulty programmable logic blocks (PLBs) in field programmable gate arrays (FPGAs) with maximum diagnostic resolution. Unlike conventional BIST, FPGA BIST does not involve any area overhead or performance degradation. We also identify and solve the problem of testing configuration...
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