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A key challenge currently limiting the wide spread acceptance of Cu(In,Ga)Se2 (CIGS) thin-film photovoltaic technologies in building integrated photovoltaic (BIPV) systems is the demonstration of product reliability in accelerated testing to support rapid product improvement cycles and new product introduction. To augment multi-year & geographically diverse real world performance a priori, one...
In this paper, we propose the use of ad-hoc scrubbing sequences to improve memory reliability. The key idea is to exploit the locality of the errors caused by a Multiple Cell Upset (MCU) to make scrubbing more efficient. The starting point is the MCU distributions for a given device. A procedure is presented that uses that information to determine an ad-hoc scrubbing sequence that maximizes reliability...
This document presents a compilation of results from tests performed by iRoC Technologies on SER induced by alpha particles on SRAM memories for technology nodes from 180 nm to 65 nm. The aim of this study is to establish the variation of sensitivity with technology node for SEU and MCU, and to analyze the possible influence of different designs and technological parameters at a given technology node.
This paper describes a methodology for building a reliable internet core router that considers the vulnerability of its electronic components to single event upset (SEU). It begins with a set of meaningful system level metrics that can be related to product reliability requirements. A specification is then defined that can be effectively used during the system architecture, silicon and software design...
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