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IEEE Embedded Systems Letters > 2017 > 9 > 1 > 21 - 24
IEEE Transactions on Reliability > 2015 > 64 > 1 > 167 - 181
IEEE Embedded Systems Letters > 2017 > 9 > 1 > 21 - 24
IEEE Transactions on Reliability > 2015 > 64 > 1 > 167 - 181