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Present and future semiconductor technologies are characterized by increasing parameters variations as well as an increasing susceptibility to external disturbances. Transient errors during system operation are no longer restricted to memories but also affect random logic, and a robust design becomes mandatory to ensure a reliable system operation. Self-checking circuits rely on redundancy to detect...
In many DSP applications (image and voice processing, baseband symbol decoding in high quality communication channels) several dBs of SNR loss can be tolerated without noticeable impact on system level performance. For power optimization in such applications, voltage overscaling can be used to operate the arithmetic circuitry slower than the critical circuit path delay while incurring tolerable SNR...
This report describes the techniques used to obtain two three-variable universal logic blocks from NAND circuits. The emphasis for one of these ULB's is on minimizing NAND blocks; for the other ULB, it is on minimizing input pins. The techniques used for the three variable ULB realization are extended to handle realization of a four-variable ULB. Possible compromises to be made in the ULB approach...
The inherent problems of data transmission in a strictly feedforward line have been discussed in the literature. In such a line, where the stored data are indexed forward by control pulses moving in a direction away from the data source, if time variations exist in the delays of successive stages then there is always a nonzero probability that two successive control pulses will eventually appear at...
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