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Present and future semiconductor technologies are characterized by increasing parameters variations as well as an increasing susceptibility to external disturbances. Transient errors during system operation are no longer restricted to memories but also affect random logic, and a robust design becomes mandatory to ensure a reliable system operation. Self-checking circuits rely on redundancy to detect...
In many DSP applications (image and voice processing, baseband symbol decoding in high quality communication channels) several dBs of SNR loss can be tolerated without noticeable impact on system level performance. For power optimization in such applications, voltage overscaling can be used to operate the arithmetic circuitry slower than the critical circuit path delay while incurring tolerable SNR...
Soft errors induced by cosmic radiation have become an urgent issue for ultra-deep-sub-micron (UDSM) technologies. In this paper, we propose a new radiation hardened by design latch (RHBDL). RHBDL can improve robustness by masking the soft errors induced by SEU and SET. We evaluate the propagation delay, power dissipation and power delay product of RHBDL using SPICE simulations. Compared with existing...
This paper deals with hazards on out-puts of combinational switching circuits for multiple input changes. Certain types of function hazards are defined and are shown to be impossible to eliminate with any logic realization. Also, an interrelation between static and dynamic function hazards is established. Hazards due to delays in the logic are defined and a method of elimination is given for both...
The inherent problems of data transmission in a strictly feedforward line have been discussed in the literature. In such a line, where the stored data are indexed forward by control pulses moving in a direction away from the data source, if time variations exist in the delays of successive stages then there is always a nonzero probability that two successive control pulses will eventually appear at...
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