Search results
IEEE Design & Test > 2017 > 34 > 6 > 84 - 93
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 802 - 804
IEEE Wireless Communications Letters > 2017 > 6 > 4 > 558 - 561
IEEE Transactions on Computers > 2017 > 66 > 6 > 1085 - 1090
IEEE Communications Letters > 2017 > 21 > 4 > 694 - 697
IEEE Transactions on Computers > 2016 > 65 > 12 > 3766 - 3779
IEEE Transactions on Computers > 2016 > 65 > 9 > 2932 - 2938
IEEE Transactions on Information Forensics and Security > 2016 > 11 > 9 > 2065 - 2076
IEEE Journal of Solid-State Circuits > 2016 > 51 > 8 > 1938 - 1951
IEEE Transactions on Computers > 2016 > 65 > 6 > 2005 - 2009
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 2 > 269 - 271
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2015 > 23 > 8 > 1448 - 1458
IEEE Transactions on Circuits and Systems II: Express Briefs > 2015 > 62 > 4 > 387 - 391
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 1 > 75 - 81
IEEE Transactions on Communications > 2015 > 63 > 3 > 605 - 616
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2014 > 22 > 7 > 1635 - 1639
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 2 > 664 - 671
IEEE Transactions on Communications > 2013 > 61 > 10 > 4096 - 4107
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 3 > 420 - 422
IEEE Transactions on Information Theory > 2013 > 59 > 11 > 7747 - 7760