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Measurements of the phosphorescence of cerium-doped gadolinium oxyorthosilicate (GSO:Ce) crystals in a high-radiation environment with dose rates higher than 5 Gy/h have revealed the presence of a strong component of phosphorescent light. Such component, at times reaching values as high as the irradiation itself, could disturb planned orthogonal ray imaging systems, where megavoltage linacs deliver...
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