The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
Epitaxial growth of 4H-SiC is reported in a horizontal low-pressure hot-wall (LP-HW-CVD) reactor at temperature 1580degC and 100 mbar. The substrates were Si-face, n-type, 4H-SiC oriented 8deg off-axis toward the [1 12 macr 0] direction. Surface of SiC epitaxial layers were studied. Atomic force microscope (AFM) and scanning electron microscopy (SEM) were used to investigate the epitaxial layer surface...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.