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In this paper, we present a new technique to improve the reliability of H-tree SRAM memories. This technique deals with the SRAM power-bus monitoring by using built-in current sensor (BICS) circuits that detect abnormal current dissipation in the memory power-bus. This abnormal current is the result of a single-event upset (SEU) in the memory and it is generated during the inversion of the state of...
Continuous scaling, necessary for enhanced performance and cost reduction, has pushed existing CMOS materials much closer to their intrinsic reliability limits, forcing reliability engineers to get a better understanding of circuit failure. This requires that designers will have to be very careful with phenomena such as high current densities or voltage overshoots. In addition to the reliability issues,...
Class D amplifiers are becoming the most feasible solution for embedded audio application. However, distortions due to the non-linear nature of switching stage are the main drawback for this amplifier topology. This paper discusses the design and implementation of high fidelity audio class D using sliding mode control scheme. This design method proves to be a cost effective solution for industrial...
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