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IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 44 - 49
IEEE Electron Device Letters > 2007 > 28 > 7 > 646 - 648
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 44 - 49
IEEE Electron Device Letters > 2007 > 28 > 7 > 646 - 648