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Fault diagnosis is extremely important to ramp up the manufacturing yield and in some cases to reduce the product debug time as well. In this paper, we have proposed a novel technique to analyze multiple fault diagnosis based on multiple fault injection. Almost all the conventional fault diagnosis method simulate one fault (among the candidate faults) at a time and based on the number of failed patterns...
In this paper, we propose a new search technique for ATPG, called CONCAT [1], which (a) is based on AND/OR reasoning, (b) integrates conflict driven learning, and (c) avoids over specification of test vectors. The technique works seamlessly (i) between Boolean and non-Boolean gates in industrial designs, (ii) across phases in latch-based designs, (iii) between justification and propagation tasks in...
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