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Fully stabilised zirconia (FSZ) samples have been implanted with helium-ions of different energies (200 keV and 1 MeV) and with different fluences (1.4x10 13 -1.4x10 16 He + /cm 2 ). Neutron depth profiling (NDP) for different annealing temperatures and effusion experiments in two different experimental systems with different thermal annealings have been performed...
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