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A modular compact model for memristors which describes a wide range of memristive devices is presented. Its modular structure enables the modeling of various device behaviors by adopting different functions inside the comprising blocks. Rooted from the theoretical analysis on ideal memristors, the window function of the model is uniquely based on the constitutive relationship between charge and flux...
The dramatic increase in leakage current, coupled with the swell in process variability in nano-scaled CMOS technologies, has become a major issue for future IC design. Moreover, due to the spread of leakage power values, leakage variability cannot be neglected anymore. In this work an accurate analytic estimation and modeling methodology has been developed for logic gates leakage under statistical...
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