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2010 International Conference on Electronics and Information Engineering > 1 > V1-405 - V1-408
IEEE Transactions on Pattern Analysis and Machine Intelligence > 2008 > 30 > 1 > 174 - 179
2010 International Conference on Electronics and Information Engineering > 1 > V1-405 - V1-408
IEEE Transactions on Pattern Analysis and Machine Intelligence > 2008 > 30 > 1 > 174 - 179