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IEEE Transactions on Instrumentation and Measurement > 2013 > 62 > 5 > 1107 - 1117
IEEE Journal of Solid-State Circuits > 2008 > 43 > 4 > 778 - 786
IEEE Transactions on Instrumentation and Measurement > 2013 > 62 > 5 > 1107 - 1117
IEEE Journal of Solid-State Circuits > 2008 > 43 > 4 > 778 - 786