Wyniki wyszukiwania
IEEE Transactions on Instrumentation and Measurement > 2010 > 59 > 4 > 805 - 813
2008 Congress on Image and Signal Processing > 1 > 543 - 547
2008 Congress on Image and Signal Processing > 2 > 649 - 653
2008 Congress on Image and Signal Processing > 2 > 530 - 534
2008 Congress on Image and Signal Processing > 4 > 156 - 160