The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
In this article partial products algorithm of serial multipliers is presented and different architectures of these kinds of multipliers such as: Successive Addition, Serial-Parallel and Serial-Serial methods are surveyed. With respect to extension capability of pipeline architecture, this circuit is implemented as 4-bit serial-serial multiplier. Some problems have been found and issues were scrutinized...
Testing using a random access scan (RAS) design-for-test approach is experiencing renewed interest because of the potential for lower test application time, low power dissipation, and low test data volume compared to standard serial scan. In this paper we propose a significant modification and enhancement to the T-Flip-Flop based cell design for Random Access Scan (RAS). Importantly, the new RAS cell...
To deal with variations, statistical methodologies can be completed by monitoring techniques implemented to cope with dynamic variations while keeping optimized operating points. This paper proposes a new monitoring structure, located in parallel of a pre-defined observable flip-flop. This structure, coupled with a specific detection window generation, embedded within the clock-tree, can anticipate...
We present a practical, systematical method for the evaluation of the soft error rate (SER) of microelectronic devices. Existing methodologies, practices and tools are integrated in a common approach while highlighting the need for specific data or tools. The showcased method is particularly adapted for evaluating the SER of very complex microelectronic devices by engineers confronted to increasingly...
Field programmable gate arrays (FPGAs) are getting more and more attractive for military and aerospace applications, among others devices. The usage of non volatile FPGAs, like Flash-based ones, reduces permanent radiation effects but transient faults are still a concern. In this paper we propose a new methodology for effectively measuring the width of radiation-induced transient faults thus allowing...
The implementation of complex functionality in low-power nano-CMOS technologies leads to enhance susceptibility to parametric disturbances (environmental, and operation-dependent). The purpose of this paper is to present recent improvements on a methodology to exploit power-supply voltage and temperature variations in order to produce fault-tolerant structural solutions. First, the proposed methodology...
The objective of using logic BIST for online and periodic testing is to identify defects, like opens, resulting from the wear and tear of the circuit. We have shown that existing test sets have a low coverage for open defects located in scan flip-flops, even though such defects may affect functional operation. Existing Logic BIST structures suffer from the same limitations. A novel Logic BIST architecture...
With the event of nanoscale technologies, new physical phenomena and technological limitations are increasing the process variability and its impact on circuit yield and performances. Like combinatory cells, the sequential cells also suffer of variations, impacting their timing characteristics. Regarding the timing behaviors, setup and hold time violation probabilities are increasing. This article...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.