The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
In many DSP applications (image and voice processing, baseband symbol decoding in high quality communication channels) several dBs of SNR loss can be tolerated without noticeable impact on system level performance. For power optimization in such applications, voltage overscaling can be used to operate the arithmetic circuitry slower than the critical circuit path delay while incurring tolerable SNR...
The purpose of TAFT fault tolerance studies conducted at CNES is to prepare the space community for the significant evolution linked to the usage of COTS components for developing spacecraft supercomputers. CNES has patented the DMT and DT2 fault-tolerant architectures with 'light' features. The development of a DMT/DT2 testbench based on a PowerPC7448 microprocessor from e2v is presented in this...
Soft errors caused by ionizing radiation have emerged as a major concern for current generation of CMOS technologies and the trend is expected to get worse. Soft error rate (SER) measurement, expressed as number of failures encountered per billion hours of device operation, is time consuming and involves significant test cost. The cost stems from having to connect a device-under-test to a tester for...
With the event of nanoscale technologies, new physical phenomena and technological limitations are increasing the process variability and its impact on circuit yield and performances. Like combinatory cells, the sequential cells also suffer of variations, impacting their timing characteristics. Regarding the timing behaviors, setup and hold time violation probabilities are increasing. This article...
A high bandwidth critical path monitor (1 sample/ cycle at 4-5 GHz) capable of providing real-time timing margin information to a variable voltage/frequency scaling control loop is described. The critical path monitor tracks the critical path delay to within 1 FO2 inverter delay with a standard deviation less than 3 FO2 delays over process, voltage, temperature, and workload. The CPM is sensitive...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.