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Delay testing has become a major issue for manufacturing advanced Systems on a Chip. Automatic Test Equipment and scan techniques are usually applied in delay testing. However, the circuits under test have many circuit paths and dependent input patterns; it is hard to measure delay times accurately, especially when debugging small delay defects. We propose a Built-In Delay Measurement (BIDM) circuit...
With increased circuit complexity, frequency binning of parts has become more difficult. Traditional techniques used for binning have their limitations in terms of quality and cost of binning. In the absence of a dependable approach, the economic advantage of binning may be defeated due to a high test cost for achieving reliable quality. This paper illustrates a dependable approach for creating ATPG...
This paper presents principles and results of dynamic testing of an SRAM-based FPGA using time- resolved fault injection with a pulsed laser. The synchronization setup and experimental procedure are detailed. Fault injection results obtained with a DES crypto-core application implemented on a Xilinx Virtex II are discussed.
The implementation of complex functionality in low-power nano-CMOS technologies leads to enhance susceptibility to parametric disturbances (environmental, and operation-dependent). The purpose of this paper is to present recent improvements on a methodology to exploit power-supply voltage and temperature variations in order to produce fault-tolerant structural solutions. First, the proposed methodology...
Networks on chips (NoCs) provide a mechanism for handling complex communications in the next generation of integrated circuits. At the same time, lower yield in nano-technology, makes self repair communication channels a necessity in design of digital systems. This paper proposes a reliable NoC architecture based on specific application mapped onto an NoC. This architecture is capable of recovering...
In this paper, we present a new technique to improve the reliability of H-tree SRAM memories. This technique deals with the SRAM power-bus monitoring by using built-in current sensor (BICS) circuits that detect abnormal current dissipation in the memory power-bus. This abnormal current is the result of a single-event upset (SEU) in the memory and it is generated during the inversion of the state of...
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