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With the foreseeable explosive growth of small cell deployment, backhaul has become the next big challenge in the next generation wireless networks. Heterogeneous backhaul deployment using different wired and wireless technologies may be a potential solution to meet this challenge. Therefore, it is of cardinal importance to evaluate and compare the performance characteristics of various backhaul technologies...
This paper presents principles and results of dynamic testing of an SRAM-based FPGA using time- resolved fault injection with a pulsed laser. The synchronization setup and experimental procedure are detailed. Fault injection results obtained with a DES crypto-core application implemented on a Xilinx Virtex II are discussed.
The dramatic increase in leakage current, coupled with the swell in process variability in nano-scaled CMOS technologies, has become a major issue for future IC design. Moreover, due to the spread of leakage power values, leakage variability cannot be neglected anymore. In this work an accurate analytic estimation and modeling methodology has been developed for logic gates leakage under statistical...
Simple ring-oscillator circuit has been used to estimate the degradation in circuit performance due to negative bias temperature instability (NBTI) effect but it fails to isolate the degradation from the NBTI for PMOS and the positive bias temperature instability (PBTI) for NMOS in high-K dielectric/metal gate CMOS technology. In this paper, we propose new circuit structures which monitor the NBTI...
A special round robin (RR) algorithm has been developed to equalize nickel metal hydride (NiMH) battery packs using a new selective equalizer. This algorithm detects batteries either at a very low state of charge (SOC) or at an extremely high SOC. In this system, a set of electromechanical relays are connected in a matrix to route boost current to the weaker batteries. The relay switching is controlled...
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