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In this paper, we discuss the calibration procedure and performance of the poly-heater measurement technique for device characterization and reliability issues. We put a particular emphasis on the accessible temperature range, the heating and cooling dynamics, as well as on the impact of temperature gradient between the heater, device, and thermo chuck. In this context, the poly-heater technique provides...
A physical yet analytical phase change memory (PCM) model simultaneously accounting for thermal and electrical conductivities is presented. Due to the physics based nature of the model, the essential temperature from heating and cooling of PCM during operation is instantaneously updated. More importantly, the model can be applied to non-conventional circuit design technique. We show that for the first...
In deep submicron era, to prevent larger amount of SRAM from more frequently encountered overheating problems and react accordingly for each possible hotspots, multiple ideal run-time temperature sensors must be closely located and response rapidly to secure system reliability while maintaining core frequency. This paper presented a method to extract run-time temperature information from multiple...
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