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The development of new generation nonvolatile memories, such as Phase Change Memories (PCMs) and Resistive-RAMs (ReRAMs), calls for accurate and controllable programming pulses, which are fundamental to adequately characterize the memory cell. Indeed, the final cell state depends on parameters of the applied programming pulse(s), such as amplitude, duration, and fall time. The performance and the...
Semiconductor memories most specifically Static Random Access Memories (SRAMs) are becoming very popular in today's System-On-Chip (SOCs). Memories become more susceptible to faults when the complexity of these memories increase as the technology shrinks. In order to detect these faults, March algorithm has been widely used. This detection of faults in SRAM has been a time consuming process. Hence...
March tests have been found to be very effective for fault detection and diagnosis in memories. Effectiveness of a March test is usually decided by the number of faults that can be detected using the test. The more the number of fault models covered, the better the test. March tests with good fault coverage have been developed but the test power also plays an important role in deciding the effectiveness...
We proposed the systematic tools, RAMSES-M and TAGS-M, for test and diagnosis algorithms evaluation and development, respectively. In addition to traditional memory fault models, the tools support the MRAM specific fault model, Write Disturbance Fault (WDF) and its specific test operation, Read-previous, which is proposed in this paper, too. The concept of Weighted Fault Coverage (WFC) is introduced...
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