Search results
2008 Congress on Image and Signal Processing > 4 > 176 - 180
IEEE Transactions on Instrumentation and Measurement > 2008 > 57 > 8 > 1786 - 1790
2008 Congress on Image and Signal Processing > 4 > 176 - 180
IEEE Transactions on Instrumentation and Measurement > 2008 > 57 > 8 > 1786 - 1790