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2010 IEEE International Reliability Physics Symposium > 1099 - 1104
IEEE Electron Device Letters > 2010 > 31 > 9 > 909 - 911
IEEE Transactions on Nuclear Science > 2010 > 57 > 4-1 > 1924 - 1932
2010 IEEE International Reliability Physics Symposium > 1099 - 1104
IEEE Electron Device Letters > 2010 > 31 > 9 > 909 - 911
IEEE Transactions on Nuclear Science > 2010 > 57 > 4-1 > 1924 - 1932