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The IR-drop problem during test mode exacerbates delay defects and results in false failures. In this paper, we take the X-filling approach to reduce the IR-drop effect during an at-speed test. The main difference between our approach and the previous X-filling approaches lies in two aspects. The first one is that we take the spatial information into consideration in our approach. The second one is...
This paper addresses the issue of blocking pattern selection to reduce both leakage and peak power consumption during circuit testing using scan-based approach. The blocking pattern is used to prevent the scan-chain transitions to circuit inputs. This though reduces dynamic power significantly, can result in quite an increase in the leakage power and peak power. We have presented a novel approach...
Simultaneous switching noise (SSN) is an important issue for the design and test and actual ICs. In particular, SSN that originates from the internal logic circuitry becomes a serious problem as the speed and density of the internal circuit increase. In this paper, an on-chip monitor is proposed to detect potential logic errors in digital circuits due to the presence of SSN. This monitor checks the...
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