The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
The paper presents a new scan chain selection scheme for response compaction. The proposed solution performs selective masking of scan chains and handles a wide range of unknown state profiles, such that all X states can be eliminated in a per-cycle mode while preserving high observability of scan cells that capture errors.
To reduce test data volumes, encoded tests and compacted test responses are widely used in industry. Use of test response compaction negatively impacts fault diagnosis since the errors in responses due to defects which are captured in scan cells are not directly observed. We propose a simple and effective way to enhance the diagnostic resolution achievable by production tests with minimal increase...
In this paper, we propose a method for identifying false paths based on functional unsensitizability of path delay faults. By using RTL structural information, a number of gate level paths are bound into an RTL path and the bundle of them can be identified in a reasonable amount of time. The identified false paths are useful for over-testing reduction caused by DFT techniques, such as scan design,...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.